Jeol - JSM-7900F / Schottky Field Emission Scanning Electron Microscope

The performance that has received high praise from conventional devices such as ultra-high spatial resolution, high stability, and multipurpose, as it is, greatly improves operability, and always performs high performance without depending on the operator's skills.

  • Specification:
    • Resolution: 0.7 nm (15 kV), 1.1 nm (0.5 kV)
    • Accelerating Voltage: 0.01 to 30 kV
    • Magnification: 25 to 1,000,000X
    • Electron gun type: In-lens Schottky field-emission gun
    • Feature: Super hybrid lens, In-lens Shotkey Plus