Jeol - JEM-ARM200F NEOARM / Atomic Resolution Analytical Electron Microscope

"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.

"NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging.

  • Accelerating Voltage: 30 to 200 kV (30, 80, 200 kV: standard,  60, 120 kV: optional)