Jeol - JSM-IT200 / InTouchScope Scanning Electron Microscope

The JSM-IT200 is a cost performance based scanning electron microscope that makes the functions of the high-end model JSM-IT500 simpler and easier to use. A beginner-friendly sample exchange navigation system allows you to easily find the field of view from the sample set and start observation of the SEM image. Software for analysis tasks such as Zeromag, which enables visual field search with a light microscope sense, Live Analysis that shows elemental analysis results without being aware of analysis, and SMILE VIEWTM Lab, which can create a report together with observation / analysis became one.

  • Specification:
    • Resolution: 3 nm (30 kV), 4 nm (20 kV)
    • Accelerating Voltage: 0.5 to 30 kV
    • Magnification: 5 to 300,000X
    • Low vacuum pressure setting range: 10 to 100 Pa