- folder Scanning Electron Microscope (SEM)
- folder Transmission Electron Microscope (TEM)
- folder Electron Microscope Supplies
- folder Peripheral Equipment for Electron Optic Intrument
- folder Preparative Instrument & Attachment for EM
MAC - Quality Control Test Standards
Product Code : E023
$
MAC’s Range of Quality Control Test Standards have been thoughtfully designed and manufactured to help aid the user in checking and monitoring the performance and accuracy of their EDX/WDX-SEM equipment and to help identify any potential problems that may effect the quality of the analysis results they are achieving.
Agar Scientific - Microscopy and Lab Supplies
Product Code : E021
$
With over forty years experience as a leading international supplier, Agar Scientific specialises in consumables and equipment in support of all forms of microscopy. Their aim is to meet the needs of all those working in Biological Science and Material Science related fields.
RMC Boeckeler - PowerTome XL / Ultramicrotome
Product Code : E020-2
$$
RMC PowerTome XL – ultramicrotome for the preparation of ultra- and semi-thin sections for electron microscopy with patented Power Drive technology. Mechanical stroke force particularly advantageous for cutting hard and large specimen.
RMC Boeckeler - MR3 / Rotary Microtome
Product Code : E020-1
$$
RMC MR3 is a robust easy-to-use motorised rotary microtome with a section range of 0.5 to 60 microns ideal for a wide range of applications including: histology, material research and forensics.
Oxford - AZtecSynergy / SEM-EDS Software System
Product Code : E018
$$
AZtecSynergy combines the innovation and power in AZtecEnergy and AZtecHKL to create the ultimate materials characterisation system with simultaneous EBSD and EDS analyses. All of the tools to collect excellent integrated data are included in one place with no complicated switching from one navigator to another.
Several navigators&n...
Jeol - IB-09060CIS / Cryo Ion Slicer
Product Code : E015
$$
The IB-09060CIS Cryo ION SLICER incorporates a specimen cooling mechanism in the EM-09100IS Ion Slicer, for easy preparation of thin films/cross sections even for specimens susceptible to thermal damage.
Jeol - JEM-1400Flash / Transmission Electron Microscope
Product Code : E011
$$$
The JEM-1400Flash is used in a wide range of fields, such as biology, nanotechnology, polymer, and advanced materials. In the observation of biological specimens including macro-molecular materials, medicines, pathological sections and viruses, usually the entire view of tissues, structures, target locations and observation area are first con...
Rubis - Forceps and Tweezers
Product Code : E024
$
All of their products are made by hand from the best steel, consistent with all the rules of traditional Swiss craftsmanship.And during all processes, the products are repeatedly tested and controlled, so that no product leaves their manufacturing facilities that does not meet very highest standards.
SPI - Sample Preparation Equipment and Supplies
Product Code : E025
$
Excellence and innovation. SPI Supplies is the world’s leading supplier, manufacturer and distributor sample preparation equipment and consumable supply items for the routine operation of the typical SEM, TEM, LM, SPM and surface analysis laboratory.
EMS - Electron Microscope Supplies
Product Code : E022
$
Electron Microscopy Sciences (EMS) specializes in the manufacturing, preparation and distribution of the highest quality laboratory chemicals and microscopy supplies and equipment for electron microscopy, light microscopy, and histology.
Diatome - Diamond Knives
Product Code : E016
$
DiATOME diamond knives are compatible with all ultramicrotomes.The surfaces of the knives are hydrophilic. This property allows an easy wetting of the cutting edge, even with a very low water level. The diamond is high vacuum brazed onto a metal shank which is securely screwed into the boat. The cementing material seals boat and k...
Emsis - Camera and Imaging Software
Product Code : E017
$$
Camera Systems for TEMs: Side Mounted and On Axis camera systems from 2.8 to 20 megapixel resolution.
Software: Imaging software for electron microscopy applications for scanning and transmission electron microscopes.
Quorum - K850WM / Critical Point Dryer
Product Code : E019-2
$$
Quorum make a range of critical point dryers to meet the needs of electron microscopy (EM) and other applications. The K850WM is a compact, bench-top instrument designed to critical point dry a complete 6"/150 mm wafer. A convenient wafer holder allows rapid transfer and ensures that pre-drying does not occur.
Quorum - Q Plus Series / Coating System
Product Code : E019-1
$$
The Q Plus Series is the latest version of Quorum's internationally acclaimed, market-leading range of sputter and carbon coaters. They are increasingly used in high-resolution microscopy, where ultra-fine coating is a must.
Jeol - IB-19520CCP / Cooling Cross Section Polisher
Product Code : E013
$$
The IB-19520CCP Cooling CROSS SECTION POLISHER incorporates a specimen cooling system suitable for specimens susceptible to beam damage. A new air isolation system transfers a specimen between SEM and CP in an airisolated environment. Its unique cooling system can cool the specimen for 8 h or more only with 1 L liquid nitrogen, enabling...
Jeol - EM-09100IS / Ion Slicer
Product Code : E014
$$
The ION SLICER prepares a crosssection specimen for TEM. It irradiates a pre-processed section with an argon ion beam along a masking belt placed on the specimen. Compared with ion milling, this tool can dramatically reduce pre-processed time of the specimen.
Jeol - JEC-3000FC / Auto Fine Coater
Product Code : E012
$$
This device consists of a main unit and a rotary pump, and is used mainly to prepare specimens for scanning electron microscopes. Various types of coatings can be deposited onto biological and other non-conductive specimens efficiently in a short time.
Jeol - JEM-2100Plus / Transmission Electron Microscope
Product Code : E010
$$$
The JEM-2100Plus is a multi-purpose Transmission Electron Microscope, combining the proven optic system of the original JEM-2100 with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to me...
Jeol - JEM-F200 / Multi-purpose Electron Microscope
Product Code : E009
$$$
The JEM-F200 is a new field emission TEM, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, a smart appearance, and various environmentally friendly system.
Accelerating Voltage: 20 to 200 kV
Jeol - JSM-7900F / Schottky Field Emission Scanning Electron Microscope
Product Code : E001
$$$
The performance that has received high praise from conventional devices such as ultra-high spatial resolution, high stability, and multipurpose, as it is, greatly improves operability, and always performs high performance without depending on the operator's skills.
Specification:
Resolution: 0.7 nm (15 kV), 1.1 nm (0.5 kV)
Accelerating Volt...
Jeol - JSM-7610F PLUS / Schottky Field Emission Scanning Electron Microscope
Product Code : E002
$$$
The electron optical system of the JSM-7610F, which has been well received, has been reviewed, and the resolution has been further improved (15 kV 0.8 nm, 1 kV 1.0 nm), and it has been renewed as the JSM-7610F Plus. A semi-in-lens objective lens and High Power Optics irradiation system are adopted, enabling stable observation and analysis of...
Jeol - JSM-7200F / Schottky Field Emission Scanning Electron Microscope
Product Code : E003
$$$
JSM-7200F is equipped with an electron optical system that applies the technology of “In-lens Shotkey Plus” adopted by our flagship machine, JSM-7800FPRIME, and TTLS (through-the-lens system) as standard equipment. Under both conditions of high acceleration voltage and low acceleration voltage, the spatial resolution has been sign...
Jeol - JSM-IT500HR / InTouchScope Scanning Electron Microscope
Product Code : E004
$$$
JSM-IT500HR is a new model of JEOL InTouchScope series. The high-brightness electron gun was installed on the "Borderless SEM JSM-IT 500", where the software for analysis work became a single task and the work speed was dramatically improved from the view set to the report creation. Faster surprise image quality observation and high se...
Jeol - JSM-IT500 / InTouchScope Scanning Electron Microscope
Product Code : E005
$$$
JSM-IT500 is a new model of JEOL InTouchScope series. From vision set to report creation, software for analysis work becomes one and work speed is up! I can do it. It is a Borderless SEM that is even easier to operate.
Specification:
Resolution: 3 nm (30 kV), 4 nm (20 kV)
Accelerating Voltage: 0.3 to 30 kV
Magnification: 5 to 300,0...
Jeol - JSM-IT200 / InTouchScope Scanning Electron Microscope
Product Code : E006
$$$
The JSM-IT200 is a cost performance based scanning electron microscope that makes the functions of the high-end model JSM-IT500 simpler and easier to use. A beginner-friendly sample exchange navigation system allows you to easily find the field of view from the sample set and start observation of the SEM image. Software for analysis tasks such as...
Jeol - JCM-7000 / Neoscope Tabletop Scanning Electron Microscope
Product Code : E007
$$$
JCM-7000 is a desktop scanning electron microscope with the concept that "everyone can operate SEM / EDS". "Zeromag" where SEM images can be observed by expanding the optical image, "Live Analysis" where elements of the field of view are being observed without launching the analyzer, "Live 3D" where three-dimensional observation is possible during...
Jeol - JEM-ARM200F NEOARM / Atomic Resolution Analytical Electron Microscope
Product Code : E008
$$$
"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.
"NEOARM" is also equipped with an...
MAC - Quality Control Test Standards
Product Code : E023
$
MAC’s Range of Quality Control Test Standards have been thoughtfully designed and manufactured to help aid the user in checking and monitoring the performance and accuracy of their EDX/WDX-SEM equipment and to help identify any potential problems that may effect the quality of the analysis results they are achieving.
Agar Scientific - Microscopy and Lab Supplies
Product Code : E021
$
With over forty years experience as a leading international supplier, Agar Scientific specialises in consumables and equipment in support of all forms of microscopy. Their aim is to meet the needs of all those working in Biological Science and Material Science related fields.
RMC Boeckeler - PowerTome XL / Ultramicrotome
Product Code : E020-2
$$
RMC PowerTome XL – ultramicrotome for the preparation of ultra- and semi-thin sections for electron microscopy with patented Power Drive technology. Mechanical stroke force particularly advantageous for cutting hard and large specimen.
RMC Boeckeler - MR3 / Rotary Microtome
Product Code : E020-1
$$
RMC MR3 is a robust easy-to-use motorised rotary microtome with a section range of 0.5 to 60 microns ideal for a wide range of applications including: histology, material research and forensics.
Oxford - AZtecSynergy / SEM-EDS Software System
Product Code : E018
$$
AZtecSynergy combines the innovation and power in AZtecEnergy and AZtecHKL to create the ultimate materials characterisation system with simultaneous EBSD and EDS analyses. All of the tools to collect excellent integrated data are included in one place with no complicated switching from one navigator to another.
Several navigators&n...
Jeol - IB-09060CIS / Cryo Ion Slicer
Product Code : E015
$$
The IB-09060CIS Cryo ION SLICER incorporates a specimen cooling mechanism in the EM-09100IS Ion Slicer, for easy preparation of thin films/cross sections even for specimens susceptible to thermal damage.
Jeol - JEM-1400Flash / Transmission Electron Microscope
Product Code : E011
$$$
The JEM-1400Flash is used in a wide range of fields, such as biology, nanotechnology, polymer, and advanced materials. In the observation of biological specimens including macro-molecular materials, medicines, pathological sections and viruses, usually the entire view of tissues, structures, target locations and observation area are first con...
Rubis - Forceps and Tweezers
Product Code : E024
$
All of their products are made by hand from the best steel, consistent with all the rules of traditional Swiss craftsmanship.And during all processes, the products are repeatedly tested and controlled, so that no product leaves their manufacturing facilities that does not meet very highest standards.
SPI - Sample Preparation Equipment and Supplies
Product Code : E025
$
Excellence and innovation. SPI Supplies is the world’s leading supplier, manufacturer and distributor sample preparation equipment and consumable supply items for the routine operation of the typical SEM, TEM, LM, SPM and surface analysis laboratory.
EMS - Electron Microscope Supplies
Product Code : E022
$
Electron Microscopy Sciences (EMS) specializes in the manufacturing, preparation and distribution of the highest quality laboratory chemicals and microscopy supplies and equipment for electron microscopy, light microscopy, and histology.
Diatome - Diamond Knives
Product Code : E016
$
DiATOME diamond knives are compatible with all ultramicrotomes.The surfaces of the knives are hydrophilic. This property allows an easy wetting of the cutting edge, even with a very low water level. The diamond is high vacuum brazed onto a metal shank which is securely screwed into the boat. The cementing material seals boat and k...
Emsis - Camera and Imaging Software
Product Code : E017
$$
Camera Systems for TEMs: Side Mounted and On Axis camera systems from 2.8 to 20 megapixel resolution.
Software: Imaging software for electron microscopy applications for scanning and transmission electron microscopes.
Quorum - K850WM / Critical Point Dryer
Product Code : E019-2
$$
Quorum make a range of critical point dryers to meet the needs of electron microscopy (EM) and other applications. The K850WM is a compact, bench-top instrument designed to critical point dry a complete 6"/150 mm wafer. A convenient wafer holder allows rapid transfer and ensures that pre-drying does not occur.
Quorum - Q Plus Series / Coating System
Product Code : E019-1
$$
The Q Plus Series is the latest version of Quorum's internationally acclaimed, market-leading range of sputter and carbon coaters. They are increasingly used in high-resolution microscopy, where ultra-fine coating is a must.
Jeol - IB-19520CCP / Cooling Cross Section Polisher
Product Code : E013
$$
The IB-19520CCP Cooling CROSS SECTION POLISHER incorporates a specimen cooling system suitable for specimens susceptible to beam damage. A new air isolation system transfers a specimen between SEM and CP in an airisolated environment. Its unique cooling system can cool the specimen for 8 h or more only with 1 L liquid nitrogen, enabling...
Jeol - EM-09100IS / Ion Slicer
Product Code : E014
$$
The ION SLICER prepares a crosssection specimen for TEM. It irradiates a pre-processed section with an argon ion beam along a masking belt placed on the specimen. Compared with ion milling, this tool can dramatically reduce pre-processed time of the specimen.
Jeol - JEC-3000FC / Auto Fine Coater
Product Code : E012
$$
This device consists of a main unit and a rotary pump, and is used mainly to prepare specimens for scanning electron microscopes. Various types of coatings can be deposited onto biological and other non-conductive specimens efficiently in a short time.
Jeol - JEM-2100Plus / Transmission Electron Microscope
Product Code : E010
$$$
The JEM-2100Plus is a multi-purpose Transmission Electron Microscope, combining the proven optic system of the original JEM-2100 with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to me...
Jeol - JEM-F200 / Multi-purpose Electron Microscope
Product Code : E009
$$$
The JEM-F200 is a new field emission TEM, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, a smart appearance, and various environmentally friendly system.
Accelerating Voltage: 20 to 200 kV
Jeol - JSM-7900F / Schottky Field Emission Scanning Electron Microscope
Product Code : E001
$$$
The performance that has received high praise from conventional devices such as ultra-high spatial resolution, high stability, and multipurpose, as it is, greatly improves operability, and always performs high performance without depending on the operator's skills.
Specification:
Resolution: 0.7 nm (15 kV), 1.1 nm (0.5 kV)
Accelerating Volt...
Jeol - JSM-7610F PLUS / Schottky Field Emission Scanning Electron Microscope
Product Code : E002
$$$
The electron optical system of the JSM-7610F, which has been well received, has been reviewed, and the resolution has been further improved (15 kV 0.8 nm, 1 kV 1.0 nm), and it has been renewed as the JSM-7610F Plus. A semi-in-lens objective lens and High Power Optics irradiation system are adopted, enabling stable observation and analysis of...
Jeol - JSM-7200F / Schottky Field Emission Scanning Electron Microscope
Product Code : E003
$$$
JSM-7200F is equipped with an electron optical system that applies the technology of “In-lens Shotkey Plus” adopted by our flagship machine, JSM-7800FPRIME, and TTLS (through-the-lens system) as standard equipment. Under both conditions of high acceleration voltage and low acceleration voltage, the spatial resolution has been sign...
Jeol - JSM-IT500HR / InTouchScope Scanning Electron Microscope
Product Code : E004
$$$
JSM-IT500HR is a new model of JEOL InTouchScope series. The high-brightness electron gun was installed on the "Borderless SEM JSM-IT 500", where the software for analysis work became a single task and the work speed was dramatically improved from the view set to the report creation. Faster surprise image quality observation and high se...
Jeol - JSM-IT500 / InTouchScope Scanning Electron Microscope
Product Code : E005
$$$
JSM-IT500 is a new model of JEOL InTouchScope series. From vision set to report creation, software for analysis work becomes one and work speed is up! I can do it. It is a Borderless SEM that is even easier to operate.
Specification:
Resolution: 3 nm (30 kV), 4 nm (20 kV)
Accelerating Voltage: 0.3 to 30 kV
Magnification: 5 to 300,0...
Jeol - JSM-IT200 / InTouchScope Scanning Electron Microscope
Product Code : E006
$$$
The JSM-IT200 is a cost performance based scanning electron microscope that makes the functions of the high-end model JSM-IT500 simpler and easier to use. A beginner-friendly sample exchange navigation system allows you to easily find the field of view from the sample set and start observation of the SEM image. Software for analysis tasks such as...
Jeol - JCM-7000 / Neoscope Tabletop Scanning Electron Microscope
Product Code : E007
$$$
JCM-7000 is a desktop scanning electron microscope with the concept that "everyone can operate SEM / EDS". "Zeromag" where SEM images can be observed by expanding the optical image, "Live Analysis" where elements of the field of view are being observed without launching the analyzer, "Live 3D" where three-dimensional observation is possible during...
Jeol - JEM-ARM200F NEOARM / Atomic Resolution Analytical Electron Microscope
Product Code : E008
$$$
"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.
"NEOARM" is also equipped with an...
